2

Temperature dependence of avalanche breakdown voltage in Si p-n junctions

Year:
1976
Language:
english
File:
PDF, 359 KB
english, 1976
4

Extended-defect reduction by uniform heating for P+-implanted Si wafers

Year:
1983
Language:
english
File:
PDF, 404 KB
english, 1983
7

The anomalous refractive index in the ellipsometric evaluation of an inhomogeneous film

Year:
1981
Language:
english
File:
PDF, 546 KB
english, 1981